Specific Academic Learning and Exam Self-Efficacy: Construct Validity by Rasch Measurement Models and Differences dependent on University Admittance Method

Research output: Contribution to conference › Conference abstract for conference › Research › peer-review

Standard

Specific Academic Learning and Exam Self-Efficacy : Construct Validity by Rasch Measurement Models and Differences dependent on University Admittance Method. / Nielsen, Tine; Dammeyer, Jesper; Makransky, Guido.

2016. Abstract from Higher Education Conference 2016, Amsterdam, Netherlands.

Research output: Contribution to conference › Conference abstract for conference › Research › peer-review

Harvard

Nielsen, T, Dammeyer, J & Makransky, G 2016, 'Specific Academic Learning and Exam Self-Efficacy: Construct Validity by Rasch Measurement Models and Differences dependent on University Admittance Method', Higher Education Conference 2016, Amsterdam, Netherlands, 13/07/2016 - 15/07/2016. <http://www.hec2016.org/content/proposals/Abstract%20til%20HE%20final%20uploaded.pdf>

APA

Nielsen, T., Dammeyer, J., & Makransky, G. (2016). Specific Academic Learning and Exam Self-Efficacy: Construct Validity by Rasch Measurement Models and Differences dependent on University Admittance Method. Abstract from Higher Education Conference 2016, Amsterdam, Netherlands. http://www.hec2016.org/content/proposals/Abstract%20til%20HE%20final%20uploaded.pdf

Vancouver

Nielsen T, Dammeyer J, Makransky G. Specific Academic Learning and Exam Self-Efficacy: Construct Validity by Rasch Measurement Models and Differences dependent on University Admittance Method. 2016. Abstract from Higher Education Conference 2016, Amsterdam, Netherlands.

Author

Nielsen, Tine ; Dammeyer, Jesper ; Makransky, Guido. / Specific Academic Learning and Exam Self-Efficacy : Construct Validity by Rasch Measurement Models and Differences dependent on University Admittance Method. Abstract from Higher Education Conference 2016, Amsterdam, Netherlands.5 p.

Bibtex

@conference{990b2cd6b6a947e2ad67b200f65dafdf,
title = "Specific Academic Learning and Exam Self-Efficacy: Construct Validity by Rasch Measurement Models and Differences dependent on University Admittance Method",
author = "Tine Nielsen and Jesper Dammeyer and Guido Makransky",
note = "page 117 of the proceedings for the HEC 2016 conference; Higher Education Conference 2016 : THE SCHOLARSHIP OF LEARNING, TEACHING, AND ORGANIZING, HEC2016 ; Conference date: 13-07-2016 Through 15-07-2016",
year = "2016",
month = jun,
language = "English",
url = "http://www.hec2016.org/",

}

RIS

TY - ABST

T1 - Specific Academic Learning and Exam Self-Efficacy

T2 - Higher Education Conference 2016

AU - Nielsen, Tine

AU - Dammeyer, Jesper

AU - Makransky, Guido

N1 - page 117 of the proceedings for the HEC 2016 conference

PY - 2016/6

Y1 - 2016/6

M3 - Conference abstract for conference

Y2 - 13 July 2016 through 15 July 2016

ER -

ID: 164455176