Characterization of conducting molecular films on silicon: Auger electron spectroscopy, X-ray photoelectron spectroscopy, atomic force microscopy and surface photovoltage
Research output: Contribution to journal › Journal article › Research
| Original language | English |
|---|---|
| Journal | Applied Surface Science |
| Issue number | 142 |
| Pages (from-to) | 591-597 |
| ISSN | 0169-4332 |
| Publication status | Published - 1999 |
ID: 152765