Characterization of conducting molecular films on Silicon: AFM, AES, XPS and surface photovoltage
Research output: Contribution to journal › Journal article › Research
Original language | English |
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Journal | Appl. Surf. Sci., |
Issue number | Vol. 142/1-4 |
Pages (from-to) | 591-597 |
Publication status | Published - 1999 |
ID: 187671